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This paper introduced the method of THz Time-Domain Spectroscopy (THz-TDS) by a series of precise
measurements on dielectrics and semiconductors. For THz-TDS, two electromagnetic pulseshapes are measured,
the input pulse and the sample pulse, having changed shape due to its passage throuth the sample under study.
Consequently, by Fourier analysis of the input and sample pulses, the frequency dependent absorption and
dispersion of the sample are obtained. The THz-TDS spectrometer introduced and used in this paper has become
the basic THz-TDS spectrometer used world-wide today.
The full citation of this paper is:
D. Grischkowsky, Soeren Keiding, Martin van Exter and Ch. Fattinger, "Far-Infrared Time-Domain Spectroscopy
with TeraHz Beams of Dielectrics and Semiconductors", JOSA-B, Vol. 7, pp. 2006-2015 (1990).
Currently this paper has 378 citations in the Citation Index of the ISI Web of Science, and is one of the
50 Most-Cited JOSA Articles within the past 90 years!
See http://josaa.osa.org/journal/josa/anniversary.cfm for more.
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